Atomic Force Microscope: Your Gateway to Nanoscale Discovery
Created on 10.20
Key Advantages：
• Unmatched Precision: Achieve true 3D surface topography at atomic scale
• Versatile Operation: Works in air, liquid, or vacuum environments
• Multiple Modes: Contact, non-contact, and tapping modes for different samples
• Broad Applications: From living cells to semiconductor wafers
Perfect For:
- Materials Science Research
- Quality Control in Manufacturing
- Biomedical Studies
- Semiconductor Inspection
- Renewable Energy Development
What Makes Our AFM Special
✅ Easy-to-use software
✅ Stable and reliable performance
✅ Complete technical support
✅ Regular system updates
Technical Highlights
- Resolution: 0.1 nm vertical, 0.2 nm lateral
- Scan Range: 100×100×15 μm
- Samples up to 200 mm diameter
Limited Time Offer
Free application evaluation and demo!
Extended warranty for first 10 orders this month.
Contact
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